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A multi-NAND Flash memory chip synchronous high temperature test device_Utility model patent certificate

2024-07-19
  • Phone：0755-82753286
  • Email：mike.li@mindersemi.com.cn
  • Address：Room 401, Building 1, Building M, No. 8, Xiawei Industrial Zone, Zhangxi Community, Guanlan Street, Longhua District, Shenzhen
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